Application software for data analysis for three-dimensional atom probe microscopy

Materials Science and Engineering: A

Volumn 327, Issue 1, 2002, Pages 29-33

  Hellman, Olof ^a   Vandenbroucke, Justin ^b   Blatz Du Rivage, John ^a   Seidman, David N ^a  

^a Northwestern University   (United States)

^b STANFORD UNIVERSITY   (United States)

Author keywords

Atom probe data analysis; Software for atom probe analysis; Three dimensional atom probe

Indexed keywords

DATA REDUCTION; GRAPHICAL USER INTERFACES; MICROSCOPIC EXAMINATION;

APPLICATION SOFTWARES; THREE-DIMENSIONAL ATOM PROBE (3DAP) MICROSCOPY;

MATERIALS SCIENCE;

ANALYSIS;

EID: 0037089969     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(01)01887-1     Document Type: Article

References (11)