Clustering and nearest neighbour distances in atom-probe tomography

Ultramicroscopy

Volumn 109, Issue 10, 2009, Pages 1304-1309

  Philippe, T ^a   De Geuser, F ^c   Duguay, S ^a   Lefebvre, W ^a   Cojocaru Miredin O ^a   Da Costa, G ^a   Blavette, D ^b  

^a UNIVERSITÉ DE ROUEN   (France)

^b INSTITUT UNIVERSITAIRE DE FRANCE   (France)

^c UNIV GRENOBLE ALPES   (France)

Author keywords

Atom probe tomography; Clustering; Nearest neighbour distances; Statistics

Indexed keywords

3-D SPACE; ATOM-PROBE TOMOGRAPHY; ATOMIC SIMULATIONS; B ATOMS; BORON-DOPED SILICON; CHEMICAL COMPOSITIONS; CLUSTERING; MATRIX; NEAREST NEIGHBOUR; NEAREST NEIGHBOUR DISTANCES; NEW APPROACHES; SI-GE ALLOYS; SMALL CLUSTERS; SOLUTE ATOMS; STATISTICAL DISTRIBUTION;

BORON; CRYSTALLIZATION; PROBES; SOLID SOLUTIONS; SOLIDIFICATION; SPACE PROBES; THREE DIMENSIONAL; TOMOGRAPHY;

ATOMS;

ALLOY; BORON; SILICON;

ARTICLE; ATOMIC PROBE TOMOGRAPHY; CHEMICAL COMPOSITION; CHEMICAL MODIFICATION; CLUSTER ANALYSIS; CONTROLLED STUDY; DISPERSION; K NEAREST NEIGHBOR; MOLECULAR INTERACTION; SIMULATION; STATISTICAL DISTRIBUTION; TOMOGRAPHY;

SIGE;

EID: 68649086109     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.06.007     Document Type: Article

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