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Volumn 10, Issue 12, 2010, Pages 5117-5122

Structural characteristics of nanometer thick Gd2O3 films grown on GaN (0001)

Author keywords

[No Author keywords available]

Indexed keywords

CROSS SECTIONAL TRANSMISSION ELECTRON MICROSCOPY; HEXAGONAL PHASE; HIGH QUALITY; HIGH TEMPERATURE; ORIENTATIONAL RELATIONSHIP; ROTATIONAL DOMAINS; STRUCTURAL CHARACTERISTICS; STRUCTURAL INVESTIGATION; SYNCHROTRON RADIATION SOURCE;

EID: 78649962874     PISSN: 15287483     EISSN: 15287505     Source Type: Journal    
DOI: 10.1021/cg100851b     Document Type: Article
Times cited : (14)

References (27)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.