An X-ray diffraction technique for analyzing basal-plane stacking faults in GaN

Physica Status Solidi (A) Applications and Materials Science

Volumn 207, Issue 11, 2010, Pages 2446-2455

  Paduano, Qing S ^a   Weyburne, David W ^a   Drehman, Alvin J ^a  

^a AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

GaN; nitride semiconductors; stacking faults; structure; X ray diffraction

Indexed keywords

ASYMMETRIC REFLECTIONS; BRAGG PEAKS; C-PLANE SAPPHIRE; COHERENCE LENGTHS; DETECTION LIMITS; FUNCTIONAL DEPENDENCE; GAN; LATTICE PLANE; LATTICE TILTS; M-PLANE; MOCVD; NITRIDE SEMICONDUCTORS; POWDER XRD; RELATIVE DENSITY; STRUCTURE; TYPICAL STACKING FAULTS; X-RAY DIFFRACTION TECHNIQUES;

DIFFRACTION; GALLIUM ALLOYS; GALLIUM NITRIDE; SAPPHIRE; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; X RAYS;

STACKING FAULTS;

EID: 78349237415     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.201026258     Document Type: Article

References (30)

1. K. Okamoto, H. Ohta, S. F. Chichibu, J. Ichihara, and, H. Takasu, Jpn. J. Appl. Phys. Part 2 46, L197. (2007).
2. M. C. Schmidt, K. C. Kim, R. M. Farrell, D. F. Feezell, D. A. Cohen, M. Saito, K. Fujito, J. S. Speck, S. P. DenBaars, and, S. Nakamura, Jpn. J. Appl. Phys. Part 2 46, L190 (2007).
3. M. C. Schmidt, K. C. Kim, H. Sato, N. Fellow, H. Masui, S. Nakamura, S. P. DenBaars, and, J. S. Speck, Jpn. J. Appl. Phys. Part 2 46, L126 (2007).
4. G. D. Metcalfe, H. Shen, M. Wraback, A. Hirai, F. Wu, and, J. S. Speck, Appl. Phys. Lett. 92, 241106 (2008).
5. S. F. Chichibu, H. Yamaguchi, L. Zhao, M. Kubota, T. Onuma, K. Okamoto, and, H. Ohta, Appl. Phys. Lett. 84, 1281 (2004).
6. D. N. Zakharov, and, Z. Liliental-Weber, Phys. Rev. B 71, 235334 (2005).
7. H. Sasaki, H. Sunakawa, N. Sumi, K. Yamamoto, and, A. Usui, J. Cryst. Growth 311, 2910 (2009).
8. Y. Sun, O. Brandt, T. Liu, A. Trampert, K. Ploog, J. Blasing, and, A. Krost, Appl. Phys. Lett. 81, 4928 (2002).
9. V. Srikant, J. S. Speck, and, D. R. Clarke, J. Appl. Phys. 82, 4286 (1997).
10. S. Lee, A. West, A. Alleman, K. Waldrip, D. Follstaedt, P. Provencio, D. Koleske, and, C. Abernathy, Appl. Phys. Lett. 86, 241904 (2005).
11. Q. S. Paduano, A. J. Drehman, D. W. Weyburne, J. Kozlowski, J. Serafinczuk, J. Jasinski, and, Z. Liliental-Weber, Phys. Status Solidi C 0, 2014 (2003).
12. M. A. Moram, and, M. E. Vickers, Rep. Prog. Phys. 72, 036502 (2009).
13. M. Moram, C. Johnston, M. Kappers, and, C. Humphreys, Physica B 404, 2189 (2009).
14. M. A. Moram, C. F. Johnston, J. L. Hollander, M. J. Kappers, and, C. J. Humphreys, J. Appl. Phys. 105, 113501 (2009).
15. B. E. Warren, X-Ray Diffraction (Addison-Wesley Publ. Co., Reading, MA, 1969).
16. A. J. C. Wilson, Proc. R. Soc. A 180, 277 (1942).
17. M. Treacy, J. Newsam, and, M. Deem, Proc. R. Soc. Lond. A 433, 499 (1991).
18. C. Delmas, and, C. Tessier, J. Mater. Chem. 7, 1439 (1997).
19. G. Koblmüller, A. Hirai, F. Wu, C. S. Gallinat, G. D. Metcalfe, H. Shen, M. Wraback, and, J. S. Speck, Appl. Phys. Lett. 93, 171902 (2008).
20. Y. S. Cho, Q. Sun, I. H. Lee, T. S. Ko, C. D. Yerinc, J. Han, B. H. Kong, H. K. Cho, and, S. Wang, Appl. Phys. Lett. 93, 111904 (2008).
21. M. B. McLaurin, A. Hiral, E. Young, F. Wu, and, J. S. Speck, Jpn. J. Appl. Phys. 47 (7), 5429 (2008).
22. Q. S. Paduano, D. W. Weyburne, and, A. J. Drehman, presented at 16th Int. Conf. on Crystal growth, Aug. 2010; J. Cryst. Growth, to be published (2010).
23. D. Hull, and, D. J. Bacon, Introduction to Dislocations (Pergamon Press, Oxford, 1984).
24. C. Stampfl, and, C. G. Van de Walle, Phys. Rev. B 57, R15052 (1998).
25. G. K. Williamson, and, W. H. Hall, Acta Metall. 1, 22 (1953).
26. V. Ratnikov, R. Kyutt, T. Shubina, T. Paskova, E. Valcheva, and, B. Monemar, J. Appl. Phys. 88, 6252 (2000).
27. P. Thompson, D. E. Cox, and, J. B. Hastings, J. Appl. Cryst. 20, 79 (1987).
28. T. Ida, M. Ando, and, H. Toraya, J. Appl. Cryst. 33, 1311 (2000).
29. T. Metzger, R. Hopler, E. Born, O. Ambacher, M. Stutzmann, R. Stommer, M. Schuster, H. Gobel, S. Christansen, M. Albrencht, and, H. P. Strunk, Philos. Mag. A 77, 1013 (1998).
30. M. E. Vickers, M. J. Kappers, R. Datta, C. McAleese, T. M. Smeeton, F. D. G. Rayment, and, C. J. Humphreys, J. Phys. D 38, A99 (2005).