메뉴 건너뛰기




Volumn 7, Issue 8, 1997, Pages 1439-1443

Stacking faults in the structure of nickel hydroxide: A rationale of its high electrochemical activity

Author keywords

[No Author keywords available]

Indexed keywords


EID: 27844468851     PISSN: 09599428     EISSN: None     Source Type: Journal    
DOI: 10.1039/a701037k     Document Type: Article
Times cited : (157)

References (11)
  • 11
    • 27844554116 scopus 로고
    • Siemens, Socabim
    • Diffrac-AT, V3-2, Siemens, Socabim, 1993.
    • (1993) Diffrac-AT, V3-2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.