메뉴 건너뛰기




Volumn 21, Issue 43, 2010, Pages

Solid-state diffusion as an efficient doping method for silicon nanowires and nanowire field effect transistors

Author keywords

[No Author keywords available]

Indexed keywords

DOPED OXIDES; DOPING CONCENTRATION; DOPING MECHANISM; DOPING METHODS; P-TYPE; PLANAR SUBSTRATE; PMOS DEVICES; SATURATION BEHAVIOR; SILICON NANOWIRES; SOLID-STATE DIFFUSION;

EID: 77958564528     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/21/43/435202     Document Type: Article
Times cited : (20)

References (22)
  • 1
    • 70349339234 scopus 로고    scopus 로고
    • Diameter-dependent dopant location in silicon and germanium nanowires
    • Xie P, Hu Y, Fang Y, Huang J and Lieber C M 2009 Diameter-dependent dopant location in silicon and germanium nanowires Proc. Natl Acad. Sci. 106 15254-8
    • (2009) Proc. Natl Acad. Sci. , vol.106 , pp. 15254-15258
    • Xie, P.1    Hu, Y.2    Fang, Y.3    Huang, J.4    Lieber, C.M.5
  • 3
    • 34250783172 scopus 로고    scopus 로고
    • Nanowire metal-oxide-semiconductor field effect transistor with doped epitaxial contacts for source and drain
    • Cohen G M et al 2007 Nanowire metal-oxide-semiconductor field effect transistor with doped epitaxial contacts for source and drain Appl. Phys. Lett. 90 233110
    • (2007) Appl. Phys. Lett. , vol.90 , pp. 233110
    • Cohen, G.M.1
  • 4
    • 61649116376 scopus 로고    scopus 로고
    • Integratable nanowire transistors
    • Quitoriano N J and Kamins T I 2008 Integratable nanowire transistors Nano Lett. 8 4410-4
    • (2008) Nano Lett. , vol.8 , pp. 4410-4414
    • Quitoriano, N.J.1    Kamins, T.I.2
  • 5
    • 61649122400 scopus 로고    scopus 로고
    • Doping limits of grown in situ doped silicon NWs using phosphine
    • Schmid H et al 2009 Doping limits of grown in situ doped silicon NWs using phosphine Nano Lett. 9 173-7
    • (2009) Nano Lett. , vol.9 , pp. 173-177
    • Schmid, H.1
  • 6
    • 72849132345 scopus 로고    scopus 로고
    • Comparison of VLS grown Si NW tunnel FETs with different gate stacks
    • Moselund K E et al 2009 Comparison of VLS grown Si NW tunnel FETs with different gate stacks Proc. ESSDERC pp 448-51
    • (2009) Proc. ESSDERC , pp. 448-451
    • Moselund, K.E.1
  • 7
    • 67650608173 scopus 로고    scopus 로고
    • Demonstration of tunneling FETs based on highly scalable vertical silicon NWs
    • Chen Z X et al 2009 Demonstration of tunneling FETs based on highly scalable vertical silicon NWs IEEE Electron Device Lett. 30 754-6
    • (2009) IEEE Electron Device Lett. , vol.30 , pp. 754-756
    • Chen, Z.X.1
  • 8
    • 47349086241 scopus 로고    scopus 로고
    • Vertical silicon-NW formation and gate-all-around MOSFET
    • Yang B et al 2008 Vertical silicon-NW formation and gate-all-around MOSFET IEEE Electron Device Lett. 29 791-4
    • (2008) IEEE Electron Device Lett. , vol.29 , pp. 791-794
    • Yang, B.1
  • 10
    • 56849128027 scopus 로고    scopus 로고
    • Ion beam doping of silicon NWs
    • Colli A et al 2008 Ion beam doping of silicon NWs Nano Lett. 8 2188-93
    • (2008) Nano Lett. , vol.8 , pp. 2188-2193
    • Colli, A.1
  • 11
    • 65249100042 scopus 로고    scopus 로고
    • Axial p-n junctions realized in silicon nanowires by ion implantation
    • Hoffmann S et al 2009 Axial p-n junctions realized in silicon nanowires by ion implantation Nano Lett. 9 1341-4
    • (2009) Nano Lett. , vol.9 , pp. 1341-1344
    • Hoffmann, S.1
  • 12
    • 33847042304 scopus 로고    scopus 로고
    • Fully depleted nanowire field-effect transistor in inversion mode
    • Hayden O et al 2007 Fully depleted nanowire field-effect transistor in inversion mode Small 3 230-4
    • (2007) Small , vol.3 , pp. 230-234
    • Hayden, O.1
  • 14
    • 76749163343 scopus 로고    scopus 로고
    • A patterned p-doping of InAs NWs by gas-phase surface diffusion of Zn
    • Ford A C et al 2010 A patterned p-doping of InAs NWs by gas-phase surface diffusion of Zn Nano Lett. 10 509-13
    • (2010) Nano Lett. , vol.10 , pp. 509-513
    • Ford, A.C.1
  • 15
    • 44649160005 scopus 로고    scopus 로고
    • Ex situ doping of silicon NWs with boron
    • Ingole S et al 2008 Ex situ doping of silicon NWs with boron J. Appl. Phys. 103 1-8
    • (2008) J. Appl. Phys. , vol.103 , pp. 1-8
    • Ingole, S.1
  • 21
    • 67049158294 scopus 로고    scopus 로고
    • Dopant profiling and surface analysis of silicon nanowires using capacitance-voltage measurements
    • Garnett E C, Tseng Y, Khanal D R, Wu J, Bokor J and Yang P 2009 Dopant profiling and surface analysis of silicon nanowires using capacitance-voltage measurements Nat. Nanotechnol. 4 311-4
    • (2009) Nat. Nanotechnol. , vol.4 , pp. 311-314
    • Garnett, E.C.1    Tseng, Y.2    Khanal, D.R.3    Wu, J.4    Bokor, J.5    Yang, P.6
  • 22
    • 65149089062 scopus 로고    scopus 로고
    • The channel length effect on the electrical performance of suspended-single-wall carbon-nanotube-based field effect transistors
    • Aïssa B and El Khakani M A 2009 The channel length effect on the electrical performance of suspended-single-wall carbon-nanotube-based field effect transistors Nanotechnology 20 175203
    • (2009) Nanotechnology , vol.20 , pp. 175203
    • Aïssa, B.1    El Khakani, M.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.