Reliability aspects of organic light emitting diodes

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2010, Pages 327-333

  Riedl, Thomas ^a   Winkler, Thomas ^b   Schmidt, Hans ^b   Meyer, Jens ^b,d   Schneidenbach, Daniel ^b   Johannes, Hans Hermann ^b   Kowalsky, Wolfgang ^b   Weimann, Thomas ^c   Hinze, Peter ^c  

^a UNIVERSITY OF WUPPERTAL   (Germany)

^b TECHNICAL UNIVERSITY OF BRAUNSCHWEIG   (Germany)

^c PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^d Princeton University   (United States)

Author keywords

Atomic layer deposition; Encapsulation; Nanolaminate; Organic light emitting diodes; Top emitter

Indexed keywords

ALD BARRIERS; BARRIER LAYERS; FUNCTIONAL ELEMENTS; GAS PERMEATION; LIGHT-EXTRACTION EFFICIENCY; MOISTURE BARRIERS; MULTILAYER STRUCTURES; NANO-LAMINATES; NANOLAMINATE; ORGANIC DEVICES; ORGANIC OPTOELECTRONICS; ORGANIC SOLAR CELL; OXIDE MATERIALS; PREPARATION TECHNOLOGY; THIN FILM ENCAPSULATION; TOP-EMITTING;

ATOMIC LAYER DEPOSITION; ATOMS; DIODES; EXTRACTION; GAS PERMEABLE MEMBRANES; LIGHT EMISSION; LIGHT EMITTING DIODES; MOISTURE; OPTICAL PROPERTIES; OXYGEN; RELIABILITY; SOLAR CELLS;

ORGANIC LIGHT EMITTING DIODES (OLED);

EID: 77957917305     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2010.5488809     Document Type: Conference Paper

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