Physical mechanism responsible for the stretched exponential decay behavior of aging organic light-emitting diodes

Applied Physics Letters

Volumn 87, Issue 21, 2005, Pages 1-3

  Fry C ^a   Racine, B ^a   Vaufrey, D ^a   Doyeux, H ^a   Cin S ^a  

^a FCA UNESP   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; DEGRADATION; EXTRAPOLATION; MATHEMATICAL MODELS; PARAMETER ESTIMATION;

EXPONENTIAL DECAY; INTRINSIC MECHANISMS; PARAMETER MODEL; RELAXATION EVENT;

LIGHT EMITTING DIODES;

EID: 27844483104     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2133922     Document Type: Article

References (7)

1. I. D. Parker, Y. Cao, and C. Y. Yang, J. Appl. Phys. 85, 2441 (1999).
2. E. Burrows, S. R. Forrest, T. X. Zhou, and L. Michalski, Appl. Phys. Lett. 76, 2493 (2000).
3. G. C. M. Silvestre, Appl. Phys. Lett. 78, 1619 (2001).
4. H. Aziz and Z. D. Popovic, Appl. Phys. Lett. 80, 2180 (2002).
5. W. E. Howard and O. F. Prache, IBM J. Res. Dev. 45, 115 (2001).
6. M. Ishii, R&D Review of Toyota CRDL 38.
7. K. Trachenko and M. T. Dove, Phys. Rev. B 70, 132202 (2004).