Ultra-high long-term stability of oxide-TTFTs under current stress

Physica Status Solidi - Rapid Research Letters

Volumn 1, Issue 5, 2007, Pages 175-177

  Riedl, T ^a   Gorrn P ^a   Holzer P ^a   Kowalsky, W ^a  

^a TECHNICAL UNIVERSITY OF BRAUNSCHWEIG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; OXIDE FILMS; STABILITY; STRESSES; THRESHOLD VOLTAGE;

CURRENT STRESS; ELECTRICAL STRESS; THRESHOLD VOLTAGE SHIFT; TRANSPARENT THIN-FILM TRANSISTOR;

THIN FILM TRANSISTORS;

EID: 36049009350     PISSN: 18626254     EISSN: 18626270     Source Type: Journal    
DOI: 10.1002/pssr.200701129     Document Type: Article

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