-
1
-
-
0242552155
-
-
1:CAS:528:DC%2BD3sXosVeitbs%3D 10.1063/1.1611263 2003JAP.94.5451T
-
KN Tu 2003 J. Appl. Phys. 94 5451 1:CAS:528:DC%2BD3sXosVeitbs%3D 10.1063/1.1611263 2003JAP....94.5451T
-
(2003)
J. Appl. Phys.
, vol.94
, pp. 5451
-
-
Tu, K.N.1
-
2
-
-
0037450236
-
-
1:CAS:528:DC%2BD3sXht1Clsb8%3D 10.1063/1.1554775 2003ApPhL.82.1045Y
-
H Ye C Basaran DC Hopkins 2003 Appl. Phys. Lett. 82 1045 1:CAS:528:DC%2BD3sXht1Clsb8%3D 10.1063/1.1554775 2003ApPhL..82.1045Y
-
(2003)
Appl. Phys. Lett.
, vol.82
, pp. 1045
-
-
Ye, H.1
Basaran, C.2
Hopkins, D.C.3
-
4
-
-
33751585505
-
Effect of entropy production on microstructure change in eutectic SnPb flip chip solder joints by thermomigration
-
DOI 10.1063/1.2385205
-
FY Ouyang KN Tu Y-S Lai AM Gusak 2006 Appl. Phys. Lett. 89 221906 10.1063/1.2385205 2006ApPhL..89v1906O (Pubitemid 44847534)
-
(2006)
Applied Physics Letters
, vol.89
, Issue.22
, pp. 221906
-
-
Ouyang, F.-Y.1
Tu, K.N.2
Lai, Y.-S.3
Gusak, A.M.4
-
6
-
-
34548455398
-
Microstructural evolution and atomic transport by thermomigration in eutectic tin-lead flip chip solder joints
-
DOI 10.1063/1.2769270
-
D Yang BY Wu YC Chan KN Tu 2007 J. Appl. Phys. 102 043502 10.1063/1.2769270 2007JAP...102d3502Y (Pubitemid 47352409)
-
(2007)
Journal of Applied Physics
, vol.102
, Issue.4
, pp. 043502
-
-
Yang, D.1
Wu, B.Y.2
Chan, Y.C.3
Tu, K.N.4
-
7
-
-
32844473264
-
-
Marcel Dekker, Inc. New York
-
K.J. Puttlitz, K.A. Stalter, Handbook of Lead-Free Solder Technology for Microelectronic Assemblies, vol. 9 (Marcel Dekker, Inc., New York, 2004), p. 282
-
(2004)
Handbook of Lead-Free Solder Technology for Microelectronic Assemblies
, vol.9
, pp. 282
-
-
Puttlitz, K.J.1
Stalter, K.A.2
-
8
-
-
28044438993
-
-
1:CAS:528:DC%2BD2MXht1Wru7%2FF 10.1007/s11664-005-0191-5 2005JEMat.34.1363Y
-
QL Yang JK Shang 2005 J. Electron. Mater. 34 1363 1:CAS:528: DC%2BD2MXht1Wru7%2FF 10.1007/s11664-005-0191-5 2005JEMat..34.1363Y
-
(2005)
J. Electron. Mater.
, vol.34
, pp. 1363
-
-
Yang, Q.L.1
Shang, J.K.2
-
9
-
-
33744485539
-
Electromigration study in the eutectic SnBi solder joint on the Ni/Au metallization
-
DOI 10.1557/jmr.2006.0113
-
L-T Chen C-M Chen 2006 J. Mater. Res. 21 962 1:CAS:528: DC%2BD28Xjs12itro%3D 10.1557/jmr.2006.0113 2006JMatR..21..962C (Pubitemid 43805184)
-
(2006)
Journal of Materials Research
, vol.21
, Issue.4
, pp. 962-969
-
-
Chen, L.-T.1
Chen, C.-M.2
-
10
-
-
33947610306
-
Electromigration-induced Bi segregation in eutectic SnBi solder joint
-
DOI 10.1007/s11664-006-0025-0
-
C-M Chen L-T Chen Y-S Lin 2007 J. Electron. Mater. 36 168 1:CAS:528:DC%2BD2sXntVKktbk%3D 10.1007/s11664-006-0025-0 2007JEMat..36..168C (Pubitemid 46478892)
-
(2007)
Journal of Electronic Materials
, vol.36
, Issue.2
, pp. 168-172
-
-
Chen, C.-M.1
Chen, L.-T.2
Lin, Y.-S.3
-
11
-
-
54449084268
-
-
1:CAS:528:DC%2BD1cXht1Chsb%2FO 10.1557/jmr.2008.0331 2008JMatR.23.2591G
-
X Gu D Yang YC Chan BY Wu 2008 J. Mater. Res. 23 2591 1:CAS:528:DC%2BD1cXht1Chsb%2FO 10.1557/jmr.2008.0331 2008JMatR..23.2591G
-
(2008)
J. Mater. Res.
, vol.23
, pp. 2591
-
-
Gu, X.1
Yang, D.2
Chan, Y.C.3
Wu, B.Y.4
-
12
-
-
67249155765
-
-
10.1063/1.3125458 2009JAP.105i3537G
-
X Gu YC Chan 2009 J. Appl. Phys. 105 093537 10.1063/1.3125458 2009JAP...105i3537G
-
(2009)
J. Appl. Phys.
, vol.105
, pp. 093537
-
-
Gu, X.1
Chan, Y.C.2
-
13
-
-
85030160489
-
-
Van Nostrand Reinhold New York
-
D.R. Frear, S.N. Burchett, H.S. Morgan, J.H. Lau, The Mechanics of Solder Alloy Interconnects, vol. 3 (Van Nostrand Reinhold, New York, 1994), p. 61
-
(1994)
The Mechanics of Solder Alloy Interconnects
, vol.3
, pp. 61
-
-
Frear, D.R.1
Burchett, S.N.2
Morgan, H.S.3
Lau, J.H.4
-
15
-
-
33947601743
-
Three-dimensional thermoelectrical simulation in flip-chip solder joints with thick underbump metallizations during accelerated electromigration testing
-
DOI 10.1007/s11664-006-0060-x
-
SW Liang YW Chang C Chen 2007 J. Electron. Mater. 36 159 1:CAS:528:DC%2BD2sXntVKktbg%3D 10.1007/s11664-006-0060-x 2007JEMat..36..159L (Pubitemid 46478891)
-
(2007)
Journal of Electronic Materials
, vol.36
, Issue.2
, pp. 159-167
-
-
Liang, S.W.1
Chang, Y.W.2
Chen, C.3
-
17
-
-
19944432174
-
Kirkendall void formation in eutectic SnPb solder joints on bare Cu and its effect on joint reliability
-
DOI 10.1063/1.1839637, 024508
-
K Zeng R Stierman T-C Chiu D Edwards K Ano KN Tu 2005 J. Appl. Phys. 97 024508 10.1063/1.1839637 2005JAP....97b4508Z (Pubitemid 40183072)
-
(2005)
Journal of Applied Physics
, vol.97
, Issue.2
, pp. 0245081-0245088
-
-
Zeng, K.1
Stierman, R.2
Chiu, T.-C.3
Edwards, D.4
Ano, K.5
Tu, K.N.6
|