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Applied Physics Letters

Volumn 97, Issue 13, 2010, Pages

Nanoscale resistive switching and filamentary conduction in NiO thin films

(6) Ye, J Y a Li, Y Q a Gao, J a Peng, H Y a Wu, S X a Wu, T a

a NANYANG TECHNOLOGICAL UNIVERSITY (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTING FILAMENT; CONDUCTIVE ATOMIC FORCE MICROSCOPES; ELECTRODE SIZE; FILAMENTARY CONDUCTION; MONTE CARLO SIMULATION; NANO SCALE; NANO SPHERE LITHOGRAPHY; NANO-ELECTRODES; NIO THIN FILM; REGULAR ARRAY; RESISTIVE SWITCHING; STRONG CORRELATION; SWITCHABLE; SWITCHING POWER;

COMPUTER SIMULATION; CONDUCTIVE FILMS; FILAMENTS (LAMP); MONTE CARLO METHODS; NANOSTRUCTURED MATERIALS; SWITCHING SYSTEMS; THIN FILMS;

SWITCHING;

EID: 77957683446 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3494267 Document Type: Article

Times cited : (38)

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