Controlling channeling effects in aberration-corrected STEM tomography

Microscopy and Microanalysis

Volumn 14, Issue SUPPL. 2, 2008, Pages 926-927

  Xin, Huolin L ^a   Intaraprasonk, Varat ^a   Muller, David A ^a  

^a Cornell University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 49549125188     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927608086054     Document Type: Conference Paper

References (9)

1. P. Batson, Ultramicroscopy 106 (2006), 1104-1114.
2. K. van Benthem et al., Ultramicroscopy 106 (2006), 1062-1068.
3. H. L. Xin et al., Applied Physics Letters 92 (2008), 013125.
4. P. M. Voyles et al., Ultramicroscopy 96 (2003), 251-273.
5. J. Einspahr, P. Voyles, Ultramicroscopy 106 (2006), 1041-1052.
6. E. Cosgriff, P. Nellist, Ultramicroscopy 107 (2007), 626-634.
7. S. Bals et al., Ultramicroscopy 104 (2005), 281-289.
8. R. F. Loane, J. Silcox, Proceedings of the 47th Annual Meeting of EMSA (1989), 124.
9. Research supported by Semiconductor Research Corporation