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Volumn 87, Issue 12, 2010, Pages 2482-2487
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Electrical analysis of organic dye-based MIS Schottky contacts
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Author keywords
Interface states; Organic thin film; Schottky diode; Series resistance
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Indexed keywords
BARRIER HEIGHTS;
ELECTRICAL ANALYSIS;
IDEALITY FACTORS;
INTERFACE STATE;
INTERFACE STATE DENSITY;
IV CHARACTERISTICS;
MIS DIODES;
MIS STRUCTURE;
ORGANIC DYE;
ORGANIC FILMS;
ORGANIC INTERLAYERS;
ORGANIC MATERIALS;
ORGANIC THIN FILMS;
POTENTIAL BARRIERS;
RECTIFYING BEHAVIORS;
SCHOTTKY CONTACTS;
SCHOTTKY DIODE;
SERIES RESISTANCES;
SI SCHOTTKY DIODE;
SI SUBSTRATES;
SPACE CHARGE REGIONS;
THIN INTERLAYERS;
DISTILLATION;
SCHOTTKY BARRIER DIODES;
SEMICONDUCTING SILICON;
SEMICONDUCTOR DIODES;
THIN FILMS;
SEMICONDUCTING SILICON COMPOUNDS;
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EID: 77956264995
PISSN: 01679317
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mee.2010.05.004 Document Type: Article |
Times cited : (65)
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References (49)
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