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Volumn 87, Issue 12, 2010, Pages 2482-2487

Electrical analysis of organic dye-based MIS Schottky contacts

Author keywords

Interface states; Organic thin film; Schottky diode; Series resistance

Indexed keywords

BARRIER HEIGHTS; ELECTRICAL ANALYSIS; IDEALITY FACTORS; INTERFACE STATE; INTERFACE STATE DENSITY; IV CHARACTERISTICS; MIS DIODES; MIS STRUCTURE; ORGANIC DYE; ORGANIC FILMS; ORGANIC INTERLAYERS; ORGANIC MATERIALS; ORGANIC THIN FILMS; POTENTIAL BARRIERS; RECTIFYING BEHAVIORS; SCHOTTKY CONTACTS; SCHOTTKY DIODE; SERIES RESISTANCES; SI SCHOTTKY DIODE; SI SUBSTRATES; SPACE CHARGE REGIONS; THIN INTERLAYERS;

EID: 77956264995     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2010.05.004     Document Type: Article
Times cited : (65)

References (49)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.