Crosstalk quantification, analysis, and trends in CMOS image sensors

Applied Optics

Volumn 49, Issue 24, 2010, Pages 4483-4488

  Blockstein, Lior ^a   Yadid Pecht, Orly ^b  

^a BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

^b UNIVERSITY OF CALGARY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ARCHITECTURE; CMOS INTEGRATED CIRCUITS; CROSSTALK; IMAGE SENSORS; METALS; MOS DEVICES; OXIDE SEMICONDUCTORS;

CMOS IMAGE SENSOR; COMPLEMENTARY METAL OXIDE-SEMICONDUCTOR IMAGE SENSOR (CMOS); PIXEL ARCHITECTURES; PIXEL CROSS-TALK; TECHNOLOGY TRENDS; THREE COMPONENT;

PIXELS;

EID: 77955916542     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.49.004483     Document Type: Article

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