-
1
-
-
0016034239
-
Carrier diffusion degradation of modulation transfer function in charge coupled imagers
-
Mar.
-
D. H. Seib, "Carrier diffusion degradation of modulation transfer function in charge coupled imagers," IEEE Trans. Electron Devices, vol. ED-21, no. 3, pp. 210-217, Mar. 1974.
-
(1974)
IEEE Trans. Electron Devices
, vol.ED-21
, Issue.3
, pp. 210-217
-
-
Seib, D.H.1
-
2
-
-
0020180686
-
Steady-state photocarrier collection in silicon imaging devices
-
Sep.
-
J. P. Lavine, E. A. Trabka, B. C. Burkey, T. J. Tredwell, E. T. Nelson, and C. N. Anagnosyopoulos, "Steady-state photocarrier collection in silicon imaging devices," IEEE Trans. Electron Devices, vol. ED-30, no. 9, pp. 1123-1134, Sep. 1983.
-
(1983)
IEEE Trans. Electron Devices
, vol.ED-30
, Issue.9
, pp. 1123-1134
-
-
Lavine, J.P.1
Trabka, E.A.2
Burkey, B.C.3
Tredwell, T.J.4
Nelson, E.T.5
Anagnosyopoulos, C.N.6
-
3
-
-
0026955061
-
A unified model of carrier diffusion and sampling aperture effects on MTF in solid-state image sensors
-
Nov.
-
E. G. Stevens, "A unified model of carrier diffusion and sampling aperture effects on MTF in solid-state image sensors," IEEE Trans. Electron Devices, vol. 39, no. 11, pp. 2621-2623, Nov. 1992.
-
(1992)
IEEE Trans. Electron Devices
, vol.39
, Issue.11
, pp. 2621-2623
-
-
Stevens, E.G.1
-
4
-
-
0028516176
-
An analytical, aperture and two-layer diffusion MTF and quantum efficiency model for solid-state image sensors
-
Oct.
-
E. G. Stevens and J. P. Lavine, "An analytical, aperture and two-layer diffusion MTF and quantum efficiency model for solid-state image sensors," IEEE Trans. Electron Devices, vol. 41, no. 10, pp. 1753-1760, Oct. 1994.
-
(1994)
IEEE Trans. Electron Devices
, vol.41
, Issue.10
, pp. 1753-1760
-
-
Stevens, E.G.1
Lavine, J.P.2
-
5
-
-
0033752389
-
The geometrical Modulation Transfer Function (MTF) - For different pixel active area shapes
-
O. Yadid-Pecht, 'The geometrical Modulation Transfer Function (MTF) - for different pixel active area shapes," Opt. Eng., vol. 39, no. 4, pp. 859-865, 2000.
-
(2000)
Opt. Eng.
, vol.39
, Issue.4
, pp. 859-865
-
-
Yadid-Pecht, O.1
-
6
-
-
0034156520
-
Photoresponse of photodiode arrays for solid-state image sensors
-
Mar./Apr.
-
J. Lee and R. Hornsey, "Photoresponse of photodiode arrays for solid-state image sensors," J. Vac. Sci. Technol. A, vol. 18, no. 2, Mar./Apr. 2000.
-
(2000)
J. Vac. Sci. Technol. A
, vol.18
, Issue.2
-
-
Lee, J.1
Hornsey, R.2
-
7
-
-
0036394816
-
Survey and comparison of focal plane MTF measurement techniques
-
T. Dutton, T. Lomheim, and M. Nelson, "Survey and comparison of focal plane MTF measurement techniques," Proc. SPIE, vol. 4486, pp. 219-246, 2001.
-
(2001)
Proc. SPIE
, vol.4486
, pp. 219-246
-
-
Dutton, T.1
Lomheim, T.2
Nelson, M.3
-
8
-
-
0036685442
-
Modulation transfer function and quantum efficiency in thin semiconductor photodetectors
-
Aug.
-
D. Abbott, "Modulation transfer function and quantum efficiency in thin semiconductor photodetectors," EDL, vol. 38, no. 16, Aug. 2002.
-
(2002)
EDL
, vol.38
, Issue.16
-
-
Abbott, D.1
-
9
-
-
0036564253
-
Analytical charge collection and MTF model for photodiode-based CMOS imagers
-
May
-
C. Lin et al., "Analytical charge collection and MTF model for photodiode-based CMOS imagers," IEEE Trans. Electron Devices, vol. 49, no. 5, pp. 754-761, May 2003.
-
(2003)
IEEE Trans. Electron Devices
, vol.49
, Issue.5
, pp. 754-761
-
-
Lin, C.1
-
11
-
-
0042411894
-
CMOS APS crosstalk characterization via a unique submicron scanning system
-
Sep.
-
_, "CMOS APS crosstalk characterization via a unique submicron scanning system," IEEE Trans. Electron Devices, vol. 50, no. 9, pp. 1994-1997, Sep. 2003.
-
(2003)
IEEE Trans. Electron Devices
, vol.50
, Issue.9
, pp. 1994-1997
-
-
-
12
-
-
0042378432
-
A unique sub-micron scanning system use for CMOS APS crosstalk characterization
-
Jan.
-
I. Shcherback, B. Belotserkovsky, and O. Yadid-Pecht, "A unique sub-micron scanning system use for CMOS APS crosstalk characterization," presented at the Proc. SPIE, Jan. 2003.
-
(2003)
Proc. SPIE
-
-
Shcherback, I.1
Belotserkovsky, B.2
Yadid-Pecht, O.3
|