A comprehensive CMOS APS crosstalk study: Photoresponse model, technology, and design trends

IEEE Transactions on Electron Devices

Volumn 51, Issue 12, 2004, Pages 2033-2041

  Shcherback, Igor ^a   Danov, Tatiana ^a   Yadid Pecht, Orly ^a  

^a BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

Author keywords

Active pixel sensor (APS); CMOS image sensor; Crosstalk; Diffusion process; Modeling; Parameter estimation

Indexed keywords

CMOS INTEGRATED CIRCUITS; DIFFUSION; INTEGRATED CIRCUIT LAYOUT; MATHEMATICAL MODELS; OPTICAL SYSTEMS; PARAMETER ESTIMATION; PHOTODIODES; SCANNING;

ACTIVE PIXEL SENSOR (APS); CMOS IMAGE SENSOR; DESIGN TRENDS; PHOTORESPONSE MODEL; PHOTOSIGNAL;

IMAGE SENSORS;

EID: 10644296350     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2004.839742     Document Type: Article

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