CMOS APS photoresponse and crosstalk optimization analysis for scalable CMOS technologies

11th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2004

Volumn , Issue , 2004, Pages 153-155

  Shcherback, Igor ^a,b   Yadid Pecht, Orly ^a,b  

^a IEEE   (Israel)

^b BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

Author keywords

CMOS APS; Photoresponse and crosstalk

Indexed keywords

CMOS APS; PHOTORESPONSE AND CROSSTALK; PHOTOSIGNAL PREDICTION; CMOS ACTIVE PIXEL SENSORS; CMOS TECHNOLOGY; GEOMETRICAL SHAPES; OPTIMISATIONS; OPTIMIZATION ANALYSIS; PHOTORESPONSES; PREDICTIVE TOOLS; SEMI-ANALYTICAL MODEL;

CROSSTALK; OPTIMIZATION; PHOTODIODES; SENSORS; CMOS INTEGRATED CIRCUITS; INTEGRATED CIRCUIT DESIGN; PIXELS;

CMOS INTEGRATED CIRCUITS; CROSSTALK;

EID: 27644563855     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)

1. I. Shcherback, O. Yadid-Pecht," Photoresponse analysis and pixel shape optimization for CMOS Active Pixel Sensors," IEEE Trans. Electron Devices, special issue on Solid-State Image Sensors, vol. 50, pp. 12-19, Jan. 2003.
2. I. Shcherback, B. Belotserkovsky, A. Belenky, O. Yadid-Pecht, "A Unique Sub-micron Scanning System use for CMOS APS crosstalk characterization" ," Proc. SPIE/IS&T Sym. on Electronic Imaging: Science and Technology, Santa Clara, CA, USA, Jan. 2003.