Optical confinement methods for continued scaling of CMOS image sensor pixels

Optics Express

Volumn 16, Issue 25, 2008, Pages 20457-20470

  Fesenmaier, Christian C ^a   Huo, Yijie ^a   Catrysse, Peter B ^a  

^a Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; CROSSTALK; DIGITAL CAMERAS; EFFICIENCY; FINITE DIFFERENCE TIME DOMAIN METHOD; IMAGE SENSORS; LIGHT; PIXELS; REFRACTIVE INDEX;

CMOS IMAGE SENSOR; CROSSTALK ELIMINATION; METAL-DIELECTRIC INTERFACE; OPTICAL CONFINEMENT; OPTICAL CROSS-TALK; OPTICAL EFFICIENCY; REFERENCE PIXELS; TOTAL INTERNAL REFLECTIONS;

TIME DOMAIN ANALYSIS;

ARTICLE; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; LIGHT; OPTICAL INSTRUMENTATION; PHOTOGRAPHY; PHOTOMETRY; RADIATION SCATTERING; SEMICONDUCTOR; SIGNAL PROCESSING; THEORETICAL MODEL; TRANSDUCER;

COMPUTER SIMULATION; COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; LENSES; LIGHT; MODELS, THEORETICAL; PHOTOGRAPHY; PHOTOMETRY; SCATTERING, RADIATION; SEMICONDUCTORS; SIGNAL PROCESSING, COMPUTER-ASSISTED; TRANSDUCERS;

EID: 57349115356     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.020457     Document Type: Article

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