Two-dimensional CMOS image sensor characterization

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn , Issue , 2006, Pages 3582-3585

  Shcherback, Igor ^a   Segal, Razy ^a   Belenky, Alexander ^a   Yadid Pecht, Orly ^a  

^a BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; CROSSTALK; FUNCTION EVALUATION; IMAGE QUALITY; OPTICAL RESOLVING POWER;

CMOS IMAGE SENSOR (CIS); SPOT LIGHT STIMULATION; SUBMICRON SCANNING SYSTEMS;

IMAGE SENSORS;

EID: 34547254690     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)

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3. I. Shcherback and O. Yadid-Pecht, Chapter 2, in "CMOS IMAGERS: FROM PHOTOTRANSDUCTION TO IMAGE PROCESSING," O. Yadid-Pecht and Ralph Etienne-Cummings (Eds.), Kluwer academic publishers, spring 2004.
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