CMOS APS crosstalk characterization via a unique submicron scanning system

IEEE Transactions on Electron Devices

Volumn 50, Issue 9, 2003, Pages 1994-1997

  Shcherback, Igor ^a   Yadid Pecht, Orly ^a  

^a BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

Author keywords

CMOS active pixel sensor (APS); Crosstalk (CTK); Diffusion process; Modeling; Point spread function (PSF)

Indexed keywords

ATOMIC FORCE MICROSCOPY; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; CROSSTALK; OPTICAL TRANSFER FUNCTION; OPTIMIZATION; PHOTODIODES; SCANNING;

ACTIVE PIXEL SENSOR; DIFFUSION PROCESS; SUBMICRON SCANNING SYSTEM;

IMAGE SENSORS;

EID: 0042411894     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2003.815594     Document Type: Article

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