A unique sub-micron scanning system use for CMOS APS crosstalk characterization

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5017, Issue , 2003, Pages 136-147

  Shcherback, Igor ^a   Belotserkovsky, Boris ^a   Belenky, Alex ^a   Yadid Pecht, Orly ^a  

^a BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

Author keywords

CMOS Active Pixel Sensor (APS); Crosstalk (CTK); Diffusion process; Modeling; Modulation Transfer Function (MTF); Point spread Function (PSF)

Indexed keywords

ARRAYS; ATOMIC FORCE MICROSCOPY; CMOS INTEGRATED CIRCUITS; DIFFUSION; OPTICAL TRANSFER FUNCTION; OPTIMIZATION; SCANNING;

ACTIVE PIXEL SENSOR (APS);

SENSORS;

EID: 0042378432     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.501126     Document Type: Conference Paper

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