Optimization of a multi-Constant Work-in-Process semiconductor assembly and test factory based on performance evaluation

Computers and Industrial Engineering

Volumn 59, Issue 2, 2010, Pages 314-322

  Li, Na ^a   Yao, Shiqing ^a   Liu, George ^b   Zhuang, Caihua ^a  

^a SHANGHAI JIAO TONG UNIVERSITY   (China)

^b INTEL CORPORATION   (United States)

Author keywords

CONWIP; Genetic Algorithm; Performance evaluation; Queue network

Indexed keywords

APPROXIMATE METHODS; CLOSED QUEUES; EVALUATION METHOD; NUMERICAL EXPERIMENTS; OPTIMAL RESULTS; OPTIMIZATION PROBLEMS; OVERLAPPING MACHINES; PERFORMANCE EVALUATION; QUEUE NETWORK; SEMICONDUCTOR ASSEMBLY; TEST FACTORIES; TEST SYSTEMS; TOTAL WORK; WORK-IN-PROCESS;

APPROXIMATION THEORY; GENETIC ALGORITHMS; OPTIMIZATION;

QUEUEING THEORY;

EID: 77955308469     PISSN: 03608352     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cie.2010.05.003     Document Type: Article

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