Real-time lossless compression for silicon debug

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 28, Issue 1, 2009, Pages 1387-1400

  Daoud, Ehab Anis ^a   Nicolici, Nicola ^a  

^a MCMASTER UNIVERSITY   (Canada)

Author keywords

Embedded logic analysis; Lossless compression; Silicon debug

Indexed keywords

ASYNCHRONOUS EVENT; DESIGN ERRORS; EMBEDDED LOGIC ANALYSIS; IN-FIELD; INTERNAL CIRCUITS; INTERNAL SIGNALS; LOSSLESS COMPRESSION; NOVEL ARCHITECTURE; OBSERVATION WINDOW; PROPOSED ARCHITECTURES; REAL-TIME DATA ACQUISITION; SILICON DEBUG;

IMAGE COMPRESSION;

DATA COMPRESSION;

EID: 77955210131     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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