Fault Localization using Time Resolved Photon Emission and STIL Waveforms

IEEE International Test Conference (TC)

Volumn , Issue , 2003, Pages 254-263

  Desplats, Romain ^a   Beaudoin, Felix ^a   Perdu, Philippe ^a   Nataraj, Nagamani ^b   Lundquist, Ted ^b   Shah, Ketan ^b  

^a CNES   (France)

^b NPTest   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC FAULT CURRENTS; ELECTRIC POTENTIAL; PHOTONS; WAVEFORM ANALYSIS;

PHOTON EMISSION;

INTEGRATED CIRCUIT TESTING;

EID: 0242334606     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

1. C.G. Talbot, "Probing Technology for IC Diagnostics", in Failure Analysis of Integrated Circuits Tools and Techniques, Chapter 7, L Wagner ed., Boston, Kluwer (1999) 113.
2. K. Wilsher, W. Lo, " Practical Optical Waveform Probing of Flip-Chip CMOS Devices", Proceed. ITC (1999) 932.
3. J.A. Kash, J.C. Tsang, "Dynamic internal testing of CMOS circuits using hot luminescence", IEEE Electron Device Lett. 18 (1997) 330.
4. R. Desplats, F. Beaudoin, G. Faggion, O. Jesson, P. Perdu, M. Leibowitz, T. Lundquist, K. Shah, "Automated PICA Transistor Channeling and Spatial Temporal Photon Correlation for Faster IC Diagnosis", IEEE-IRPS (2003) 545.
5. L. Selmi, M. Mastrapasqua, D.M. Boulin, J.D. Bude, M. Pavesi, E. Sangiorgi, M.R. Pinto, "Verification of Electron Distributions in Silicon by means of HotCarrier Luminescence Measurements", IEEE Transactions Electron Devices 45 (1998) 802.
6. J. C. Tsang, J. A. Kash, D. P. Vallett, "Picosecond Imaging Circuit Analysis", IBM J. Res. Develop. 44 (2000) 583.
7. W. Ng, G. Gao, A. Abraham, T. Lundquist, "Hot Carrier Luminescence for Backside 0.15μm CMOS Device Analysis", Proceed. IEEE-IRW (2002) 116.
8. IEEE 1450.2™, "Standard for Extensions to Standard Test Interface Language (STIL), IEEE Std. 1450-1999.
9. T. Taylor, G. A. Matson, "Standard Test-Interface Language (STIL): A New Language for Patterns and Waveforms", IEEE-ITC (1996) 565.
10. R. Desplats, G. Rolland, P. Perdu, " Faster Fault Isolation Using a Dichotomy Reduction of Node Candidates", Microelectronics Engineering (1999) 1254.