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Volumn 108, Issue 1, 2010, Pages

Enhanced diffusion upon amorphous-to-nanocrystalline phase transition in Mo/B4C/Si layered systems

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SCALE; ENHANCED DIFFUSION; GRAIN-BOUNDARY DIFFUSION; INTERFACE LAYER; LAYERED SYSTEMS; NANOCRYSTALLINE PHASE; ORDER OF MAGNITUDE; SUBNANOMETERS; THIN-FILM STRUCTURE;

EID: 77955206061     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3460107     Document Type: Article
Times cited : (19)

References (22)
  • 10
    • 0025625753 scopus 로고
    • JMREEE 0884-2914, 10.1557/JMR.1990.2854
    • C. M. Doland and R. J. Nemanich, J. Mater. Res. JMREEE 0884-2914 5, 2854 (1990). 10.1557/JMR.1990.2854
    • (1990) J. Mater. Res. , vol.5 , pp. 2854
    • Doland, C.M.1    Nemanich, R.J.2
  • 18
    • 77955210754 scopus 로고    scopus 로고
    • The Si-oxide peak in Fig. has actually increased due to the annealing treatment. This is attributed to postannealing exposure to the ambient. A rougher (see Fig.) and possibly more open structure are probable causes of the increased degree of oxidation
    • The Si-oxide peak in Fig. has actually increased due to the annealing treatment. This is attributed to postannealing exposure to the ambient. A rougher (see Fig.) and possibly more open structure are probable causes of the increased degree of oxidation.
  • 19
    • 0018040032 scopus 로고
    • An XPS study of the adherence of refractory carbide silicide and boride rf-sputtered wear-resistant coatings
    • DOI 10.1116/1.569845
    • W. A. Brainard and D. R. Wheeler, J. Vac. Sci. Technol. JVSTAL 0022-5355 15, 1800 (1978). 10.1116/1.569845 (Pubitemid 9423832)
    • (1978) J Vac Sci Technol , vol.15 , Issue.6 , pp. 1800-1805
    • Brainard William, A.1    Wheeler Donald, R.2
  • 20
    • 0037076188 scopus 로고    scopus 로고
    • TEM and SEM studies of microstructural transformations of thin iron films during annealing
    • DOI 10.1016/S0169-4332(02)00016-8, PII S0169433202000168
    • W. Lisowski, E. G. Keim, and M. Smithers, Appl. Surf. Sci. ASUSEE 0169-4332 189, 148 (2002). 10.1016/S0169-4332(02)00016-8 (Pubitemid 34740833)
    • (2002) Applied Surface Science , vol.189 , Issue.1-2 , pp. 148-156
    • Lisowski, W.1    Keim, E.G.2    Smithers, M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.