TEM and SEM studies of microstructural transformations of thin iron films during annealing

Applied Surface Science

Volumn 189, Issue 1-2, 2002, Pages 148-156

  Lisowski, Wojciech ^a   Keim, Enrico G ^b   Smithers, Mark ^b  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

^b UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

Annealing; Iron films; Roughness; Scanning and transmission electron microscopy; Structure and morphology

Indexed keywords

ANISOTROPY; ANNEALING; CRYSTAL MICROSTRUCTURE; IRON; METALLIC FILMS; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

MICROSTRUCTURAL TRANSFORMATIONS;

SURFACE ROUGHNESS;

EID: 0037076188     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00016-8     Document Type: Article

References (22)