Subnanometer-scale measurements of the interaction of ultrafast soft X-ray free-electron-laser pulses with matter

Physical Review Letters

Volumn 98, Issue 14, 2007, Pages

  Hau Riege, Stefan P ^a   Chapman, Henry N ^a   Krzywinski, Jacek ^b   Sobierajski, Ryszard ^b   Bajt, Saša ^a   London, Richard A ^a   Bergh, Magnus ^c   Caleman, Carl ^c   Nietubyc, Robert ^b   Juha, Libor ^d   Kuba, Jaroslav ^e   Spiller, Eberhard ^a   Baker, Sherry ^a   Bionta, Richard ^a   Sokolowski Tinten, K ^f   Stojanovic, Nikola ^f   Kjornrattanawanich, Benjawan ^g   Gullikson, Eric ^h   Plönjes, Elke ⁱ   Toleikis, Sven ⁱ   Tschentscher, Thomas ⁱ   more..

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b INSTITUTE OF PHYSICS   (Poland)

^c UPPSALA UNIVERSITY   (Sweden)

^d INSTITUTE OF PHYSICS   (Czech Republic)

^e CZECH TECHNICAL UNIVERSITY IN PRAGUE   (Czech Republic)

^f UNIVERSITY OF DUISBURG ESSEN   (Germany)

^g UNIVERSITIES SPACE RESEARCH ASSOCIATION   (United States)

^h LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

ⁱ DESY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; ELECTRON BEAMS; MACROMOLECULES; NANOSTRUCTURED MATERIALS; ULTRAFAST PHENOMENA;

DIFFRACTION IMAGING; FREE-ELECTRON-LASER PULSES; STRUCTURAL CHANGES; STRUCTURAL DAMAGE;

LASER PULSES;

EID: 34147142907     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.98.145502     Document Type: Article

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