Applications of the 'CATGIXRF' computer program to the grazing incidence X-ray fluorescence and X-ray reflectivity characterization of thin films and surfaces

X-Ray Spectrometry

Volumn 39, Issue 2, 2010, Pages 127-134

  Tiwari, M K ^a,b   Lodha, G S ^b   Sawhney, K J S ^a  

^a DIAMOND LIGHT SOURCE LTD   (United Kingdom)

^b RAJA RAMANNA CENTRE FOR ADVANCED TECHNOLOGY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION PROGRAMS; DEPTH PROFILING; FLUORESCENCE; INTERFACES (MATERIALS); NONDESTRUCTIVE EXAMINATION; REFLECTION;

GRAZING INCIDENCE; INTERFACE ROUGHNESS; INTERLAYER FORMATION; LAYER THICKNESS; NON DESTRUCTIVE EVALUATION; THIN SURFACES; THIN-FILMS; X RAY FLUORESCENCE; X RAY FLUORESCENCE TECHNIQUES; X RAY REFLECTIVITY;

THIN FILMS;

EID: 77954634729     PISSN: 00498246     EISSN: 10974539     Source Type: Journal    
DOI: 10.1002/xrs.1215     Document Type: Article

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