Effect of energy dependence of primary beam divergence on the X-ray standing wave characterization of layered materials

Analytical Sciences

Volumn 21, Issue 7, 2005, Pages 757-762

  Tiwari, M K ^a   Naik, S R ^a   Lodha, G S ^a   Nandedkar, R V ^a  

^a RAJA RAMANNA CENTRE FOR ADVANCED TECHNOLOGY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ELASTIC WAVES; FILM PREPARATION; MULTILAYER FILMS; MULTILAYERS; X RAYS;

ENERGY DEPENDENCE; LAYERED MATERIAL; MULTI-LAYER THIN FILM; PRIMARY BEAMS; X-RAY STANDING WAVES;

STANDING WAVE METERS;

EID: 23944486439     PISSN: 09106340     EISSN: 13482246     Source Type: Journal    
DOI: 10.2116/analsci.21.757     Document Type: Article

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