Effect of Si layer thickness on the structural properties of a Co/Si multilayer system

Journal of Physics Condensed Matter

Volumn 19, Issue 1, 2007, Pages

  Jaiswal, Archna ^a   Rai, Sanjay ^a   Tiwari, M K ^a   Reddy, V R ^b   Lodha, G S ^a   Nandedkar, R V ^a  

^a RAJA RAMANNA CENTRE FOR ADVANCED TECHNOLOGY   (India)

^b UGC DAE CONSORTIUM FOR SCIENTIFIC RESEARCH   (India)

Author keywords

[No Author keywords available]

Indexed keywords

FERROMAGNETISM; ION BEAMS; LAYERED MANUFACTURING; OPTICAL KERR EFFECT; SPUTTERING; X RAY DIFFRACTION ANALYSIS;

FERROMAGNETIC COUPLING; MAGNETO-OPTICAL KERR EFFECT (MOKE) MEASUREMENTS; SILICIDE LAYER; STRUCTURAL PROPERTIES;

MULTILAYERS;

EID: 33847182808     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/19/1/016001     Document Type: Article

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