Investigation of metal nanoparticles on a Si surface using an x-ray standing wave field

Journal of Applied Physics

Volumn 103, Issue 5, 2008, Pages

  Tiwari, M K ^a   Bhalerao, G M ^a   Babu, M ^a   Sinha, A K ^a   Mukherjee, C ^a  

^a RAJA RAMANNA CENTRE FOR ADVANCED TECHNOLOGY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; METAL ANALYSIS; MORPHOLOGY; SILICON;

ELEMENT SPECIFIC ANALYSIS; METAL NANOPARTICLES; X-RAY STANDING WAVE FIELD;

NANOPARTICLES;

EID: 40849139467     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2885346     Document Type: Article

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