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Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 52, Issue 7, 1997, Pages 805-812

Glancing incidence X-ray analysis: More than just reflectivity!

(3) Leenaers, A J G a Vrakking, J J A M a De Boer, D K G a

a PHILIPS RESEARCH LABORATORIES (Netherlands)

Author keywords

Depth profiling; Diffuse scattering; Thin layer; X ray fluorescence; X ray reflectivity

Indexed keywords

FLUORESCENCE; INTERFACES (MATERIALS); SURFACE ROUGHNESS;

DEPTH PROFILING; GLANCING INCIDENCE X RAY ANALYSIS (GIXA); X RAY REFLECTIVITY (XRR);

X RAY ANALYSIS;

EID: 0031167271 PISSN: 05848547 EISSN: None Source Type: Journal
DOI: 10.1016/S0584-8547(96)01651-5 Document Type: Article

Times cited : (16)

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