Determination of X-ray compression efficiency of a thin film X-ray waveguide structure using marker layer fluorescence

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 62, Issue 2, 2007, Pages 137-144

  Tiwari, M K ^a   Nayak, M ^a   Lodha, G S ^a   Nandedkar, R V ^a  

^a RAJA RAMANNA CENTRE FOR ADVANCED TECHNOLOGY   (India)

Author keywords

Multilayer; X ray fluorescence; X ray standing wave; X ray waveguide

Indexed keywords

FLUORESCENCE; IRON; THIN FILMS; X RAY ANALYSIS;

WAVEGUIDE STRUCTURE; X-RAY COMPRESSION EFFICIENCY; X-RAY STANDING WAVE; X-RAY WAVEGUIDE;

WAVEGUIDES;

EID: 34047114934     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2007.02.009     Document Type: Article

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