Surface and interface study of pulsed-laser-deposited off-stoichiometric NiMnSb thin films on a Si(100) substrate

Physical Review B - Condensed Matter and Materials Physics

Volumn 73, Issue 3, 2006, Pages

  Rai, S ^a   Tiwari, M K ^a   Lodha, G S ^a   Modi, M H ^a   Chattopadhyay, M K ^a   Majumdar, S ^a   Gardelis, S ^b,e   Viskadourakis, Z ^b,c   Giapintzakis, J ^b,d   Nandedkar, R V ^a   Roy, S B ^a   Chaddah, P ^a,f  

^a RAJA RAMANNA CENTRE FOR ADVANCED TECHNOLOGY   (India)

^b INSTITUTE OF ELECTRONIC STRUCTURE AND LASER   (Greece)

^c UNIVERSITY OF CRETE   (Greece)

^d UNIVERSITY OF CYPRUS   (Cyprus)

^e INSTITUTE OF MICROELECTRONICS   (Greece)

^f UGC DAE CONSORTIUM FOR SCIENTIFIC RESEARCH   (India)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33144471101     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.73.035417     Document Type: Article

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