Quantitative measurements of Kikuchi bands in diffraction patterns of backscattered electrons using an electrostatic analyzer

Ultramicroscopy

Volumn 109, Issue 10, 2009, Pages 1211-1216

  Went, M R ^a   Winkelmann, A ^b   Vos, M ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^b MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

Electron backscatter diffraction; Electrostatic analyzer; Kikuchi pattern

Indexed keywords

BACKSCATTERING; DIFFRACTION PATTERNS; ELECTRON DIFFRACTION; ELECTRON SCATTERING; ELECTROSTATICS; ENERGY DISSIPATION; INTERFEROMETRY; SCANNING ELECTRON MICROSCOPY;

CRYSTALLOGRAPHIC INFORMATION; ELECTRON BACK SCATTER DIFFRACTION; ELECTROSTATIC ANALYZER; HIGH SPATIAL RESOLUTION; KIKUCHI PATTERNS; QUANTITATIVE COMPARISON; QUANTITATIVE MEASUREMENT; THE SCANNING ELECTRON MICROSCOPES (SEM);

ELECTRONS;

ANALYZER; ARTICLE; CONTROLLED STUDY; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; ELECTROSTATIC ANALYZER; GEOMETRY; SCANNING ELECTRON MICROSCOPY; SIMULATION; SPECTROMETER; THEORETICAL MODEL;

EID: 68549107656     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.05.004     Document Type: Article

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