Automated crystal lattice orientation mapping using a computer-controlled sem

Micron

Volumn 28, Issue 3, 1997, Pages 249-265

  Schwarzer, Robert A ^a  

^a Inst F Metallkunde Metallphysik   (Germany)

Author keywords

ACOM; Backscatter Kikuchi pattern; BKD; BKP; Crystal texture; EBSD; Grain boundary; OIM; Phase discrimination

Indexed keywords

EID: 0030987694     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(97)00010-3     Document Type: Review

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