A sub-50 meV spectrometer and energy filter for use in combination with 200 kV monochromated (S)TEMs

Ultramicroscopy

Volumn 96, Issue 3-4, 2003, Pages 367-384

  Brink, H A ^a   Barfels, M M G ^a   Burgner, R P ^a   Edwards, B N ^a  

^a GATAN INC   (United States)

Author keywords

Aberration correction; EELS; High stability; Spectrometer

Indexed keywords

ABERRATIONS; ENERGY DISSIPATION; LENSES; PRISMS; SPECTROMETERS; TRANSMISSION ELECTRON MICROSCOPY;

ENERGY FILTERS;

MONOCHROMATORS;

CONFERENCE PAPER; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONICS; ENERGY TRANSFER; OPTICAL RESOLUTION; SPECTROMETER; TRANSMISSION ELECTRON MICROSCOPY;

ANGUILLIFORMES;

EID: 0037626657     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(03)00102-5     Document Type: Conference Paper

References (36)

1. Varlot K., Martin J.M., Quet C. J. Microsc. 191(2):1998;187.
2. Hunt J.A., Disko M.M., Behal S.K., Leapman R.D. Ultramicroscopy. 58:1995;55.
3. Batson P.E. J. Microsc. 49(2):2000;267.
4. Reed B.W., Sarikaya M. J. Electron Microsc. 51(S):2002;S97.
5. S. Takeda, M. Terauchi, M. Tanaka, M. Kohyama, Electron Microscopy 1994, Proceedings of the 13th International Congress on Electron Microscopy, Paris, Vol. 3, p. 567.
6. van Benthem K., French R.H., Sigle W., Elsaesser C., Ruehle M. Ultramicroscopy. 86:2001;303.
7. Fink J., Nuecker N., Pellegrin E., Romberg H., Alexander M., Knupfer M. J. Electron Spectrosc. Relat. Phenom. 66:1994;395.
8. C. Mitterbauer, G. Kothleitner, H. Zandbergen, B. Freitag, P. Tiemeijer, F. Hofer, in these Proceedings (SALSA 2002), Ultramicroscopy 96 (3-4) (2003).
9. Mizoguchi T., Yoshiya M., Li J., Oba F., Tanaka I., Adachi H. Ultramicroscopy. 86:2001;363.
10. Rez P., Alvarez J.R., Pickard C. Ultramicroscopy. 78:1999;175.
11. M. Disko, C.C. Ahn, B. Fultz (Eds.) Transmission Electron Energy Loss Spectroscopy in Materials Science, Minerals Materials Society, Pittsburgh, PA, 1992.
12. Hainfeld J., Isaacson M. Ultramicroscopy. 3:1978;87.
13. Davis J.A., Heng Y.M., arfels M.M.GB, Bisland S.K., Gariépy J., Ottensmeyer F.P. J. Electron Microsc. 49(5):2000;629.
14. Diociaiuti M., Calcabrini A., Meschini S., Arancia G. Micron. 28(5):1997;389.
15. Muller D.A., Edwards B., Kirkland E.J., Silcox J. Ultramicroscopy. 86:2001;371.
16. iemeijer P.CT Inst. Phys. Conf. Ser. 161:1999;191.
17. F. Kahl, Ph.D. Thesis, TU-Darmstadt, Germany, 1999.
18. Mook H.W., Kruit P. Ultramicroscopy. 78:1999;43.
19. N.K. Menon, J.A. Hunt, submitted for publication.
20. Tiemeijer P.C. Ultramicroscopy. 78:1999;53.
21. Gubbens A.J., Brink H.A., Kundmann M.K., Friedman S.L., Krivanek O.L. Micron. 29(1):1998;81.
22. Uhlemann S., Rose H. Optik. 96:1994;163.
23. Tsuno K. Rev. Sci. Instrum. 68:1997;109.
24. Mooney P.E., Joyce D.C., Pan M., Shi D., Subramaniam S. Biophys. J. 82(1):2002;490b.
25. G.C. Holst, Sampling, Aliasing and Data Fidelity, SPIE Optical Engineering Press, Bellingham and JCD Publishing, Winter Park, 1998.
26. M.K. Kundmann, J.A. Hunt, H.A. Brink, Automated set up of an energy filtering transmission electron microscope, United States Patent 6,184,524, 2001.
27. Golla U., Kohl H. Micron. 28(5):1997;397.
28. Mayer J., Eigenthaler U., Plitzko J.M., Dettenwanger F. Micron. 28(5):1997;361.
29. F. Tichelaar, Delft University of Technology, personal communication.
30. R.F. Egerton, Electron Energy-Loss Spectroscopy in the Electron Microscope, 2nd Edition, Plenum Press, New York, London, 1996.
31. Alexandrou I., Papworth A.J., Rafferty B., Amaratunga G.A.J., Kiely C.J., Brown L.M. Ultramicroscopy. 90:2001;39.
32. Schamm S., Zanchi G. Ultramicroscopy. 88(3):2001;211.
33. P.C. Tiemeijer, J.H.A. van Lin, B.H. Freitag, A.F. de Jong, Microscopy and Microanalysis 2002, Proceedings Quebec City, Vol. 8, No. 2, 2002, p. 70.
34. H.W. Zandbergen, F.D. Tichelaar, M.-Y. Wu, J.H. Chen, Abstracts for Strategies and Advances in Atomic Level Spectroscopy and Analysis Conference Guadeloupe, 2002, p. 21.
35. Menon N.K., Krivanek O.L. Microsc. Microanal. 8:2002;203.
36. O.L. Krivanek, Proceedings of EUREM-11 Dublin 1996 V. (1), Committee of European Societies of Microscopy, Brussels, 1998, p. 200.