Rutherford backscattering using electrons as projectiles: Underlying principles and possible applications

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 266, Issue 6, 2008, Pages 998-1011

  Went, M R ^a   Vos, M ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

Author keywords

Electron scattering; Rutherford backscattering; Surface analysis

Indexed keywords

ELASTIC SCATTERING; ELECTRON SCATTERING; ELECTRON SPECTROSCOPY; ION BEAMS; SURFACE ANALYSIS; SURFACE STRUCTURE;

ION BEAM ANALYSIS; ION SCATTERING; THICK LAYERS;

RUTHERFORD BACKSCATTERING SPECTROSCOPY;

EID: 41549089162     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2008.01.059     Document Type: Article

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