Improving the quality of electron backscatter diffraction (EBSD) patterns from nanoparticles

Journal of Microscopy

Volumn 206, Issue 2, 2002, Pages 170-178

  Small, J A ^a   Michael, J R ^b   Bright, D S ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

Crystallographic identification; EBSD; Individual particle analysis; Nanoparticles; Phase identification; SEM

Indexed keywords

ALUMINA; ALUMINUM OXIDE; ATOMS; BACKSCATTERING; BINARY ALLOYS; ELECTRON DIFFRACTION; ELECTRONS; ENERGY DISPERSIVE SPECTROSCOPY; HOUGH TRANSFORMS; MOUNTINGS; SIGNAL TO NOISE RATIO; SUBSTRATES; THIN FILMS;

CRYSTALLOGRAPHIC IDENTIFICATION; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION; INDIVIDUAL PARTICLE ANALYSIS; PATTERN QUALITY; PHASE IDENTIFICATION; QUALITY FACTORS; QUANTITATIVE COMPARISON; RELATIVE CONTRIBUTION; THIN-FILMS;

NANOPARTICLES;

ALUMINUM OXIDE; NANOPARTICLE;

ARTICLE; ATOMIC PARTICLE; DENSITY; ELECTRON DIFFRACTION; FILM; IMAGE ENHANCEMENT; IMAGE QUALITY; PARTICLE SIZE; PRIORITY JOURNAL; QUALITATIVE ANALYSIS; QUANTITATIVE ANALYSIS; SIGNAL NOISE RATIO;

EID: 0036094498     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2002.01015.x     Document Type: Article

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