Application of the short-pulse propagation technique for broadband characterization of PCB and other interconnect technologies

IEEE Transactions on Electromagnetic Compatibility

Volumn 52, Issue 2, 2010, Pages 266-287

  Deutsch, Alina ^a   Krabbenhoft, Roger S ^b   Melde, Kathleen L ^c   Surovic, Christopher W ^a   Katopis, George A ^b   Kopcsay, Gerard V ^a   Zhou, Zhen ^c,d   Chen, Zhaoqing ^b   Kwark, Young H ^a   Winkel, Thomas Michael ^e   Gu, Xiaoxiong ^a   Standaert, Theodorus E ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b IBM   (United States)

^c University of Arizona   (United States)

^d INTEL CORPORATION   (United States)

^e IBM   (Germany)

Author keywords

Dielectric permittivity; Measurement techniques; Printed circuit board (PCB) wiring; Signal integrity; Transmission line characterization

Indexed keywords

DIELECTRIC PERMITTIVITIES; MEASUREMENT TECHNIQUES; SIGNAL INTEGRITY; TRANSMISSION-LINE; TRANSMISSION-LINE CHARACTERIZATION;

COMPUTER APPLICATIONS; DIGITAL COMPUTERS; ELECTRIC LINES; PERMITTIVITY; PRINTED CIRCUIT MANUFACTURE;

PRINTED CIRCUIT BOARDS;

EID: 77952740985     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEMC.2009.2037971     Document Type: Article

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