Estimation of roughness-induced power absorption from measured surface profile data

IEEE Microwave and Wireless Components Letters

Volumn 17, Issue 7, 2007, Pages 486-488

  Gu, Xiaoxiong ^a,b   Tsang, Leung ^a,b   Braunisch, Henning ^a,c  

^a IEEE   (United States)

^b University of Washington   (United States)

^c INTEL CORPORATION   (United States)

Author keywords

Power absorption; Power spectral density (PSD); Rough surfaces

Indexed keywords

FOURIER-BESSEL TRANSFORM; POWER ABSORPTION; ROUGH SURFACES;

CORRELATION METHODS; DATA REDUCTION; ENERGY ABSORPTION; FOURIER TRANSFORMS; POWER SPECTRAL DENSITY; SURFACE MEASUREMENT;

SURFACE ROUGHNESS;

EID: 34547455440     PISSN: 15311309     EISSN: None     Source Type: Journal    
DOI: 10.1109/LMWC.2006.899296     Document Type: Article

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