Off-chip rough-metal-surface propagation loss modeling and correlation with measurements

Proceedings - Electronic Components and Technology Conference

Volumn , Issue , 2007, Pages 785-791

  Braunisch, Henning ^a   Gu, Xiaoxiong ^b   Camacho Bragado, Alejandra ^a   Tsang, Leung ^b  

^a INTEL CORPORATION   (United States)

^b University of Washington   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS PACKAGING; MATHEMATICAL MODELS; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS;

POWER SPECTRAL DENSITY (PSD); SMALL-PERTURBATION METHOD (SPM); SURFACE HEIGHT PROFILES;

PERTURBATION TECHNIQUES;

EID: 35348871225     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2007.373887     Document Type: Conference Paper

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