Comparison of time- and frequency domain measurement results for product related card and MCM transmission lines up to 65 GHz

IEEE Topical Meeting on Electrical Performance of Electronic Packaging

Volumn 2005, Issue , 2005, Pages 21-24

  Winkel, Thomas Michael ^a   Deutsch, A ^b   Katopis, George A ^c   Kopcsay, G V ^b   Klink, E ^a   Dyckman, W D ^c   Chamberlin, B J ^c   Grabinski, H ^d   Surovic, C W ^b   Liu, H ^c   Baks, C ^b  

^a IBM   (Germany)

^b IBM T J WATSON RESEARCH CENTER   (United States)

^c IBM   (United States)

^d LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MCM TEST LINE STRUCTURES; FIELD CALCULATIONS; LOW LOSS CARDS; MATERIAL PARAMETERS;

CERAMIC MATERIALS; ELECTRIC FIELDS; ELECTRIC LINES; FREQUENCY DOMAIN ANALYSIS; MULTICARRIER MODULATION;

TIME DOMAIN ANALYSIS;

EID: 33845912665     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EPEP.2005.1563690     Document Type: Conference Paper

References (8)

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