Modeling effects of random rough interface on power absorption between dielectric and conductive medium in 3-D problem

IEEE Transactions on Microwave Theory and Techniques

Volumn 55, Issue 3, 2007, Pages 511-517

  Gu, Xiaoxiong ^b   Tsang, Leung ^a,b   Braunisch, Henning ^a,c  

^a IEEE

^b University of Washington   (United States)

^c INTEL CORPORATION   (United States)

Author keywords

Perturbation methods; Power absorption; Rough surfaces; T matrix method

Indexed keywords

ABSORPTION; CORRELATION METHODS; DIELECTRIC MATERIALS; MATHEMATICAL MODELS; PERTURBATION TECHNIQUES;

CONDUCTIVE MEDIUM; GAUSSIAN CORRELATION FUNCTION; POWER ABSORPTION;

INTERFACES (MATERIALS);

EID: 33847784606     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2007.891689     Document Type: Article

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