Development and interfacial characterization of Co/Mg periodic multilayers for the EUV range

Journal of Physical Chemistry C

Volumn 114, Issue 14, 2010, Pages 6484-6490

  Le Guen, K ^a   Hu, M H ^a   Andre J M ^a   Jonnard, P ^a   Zhou, S K ^b   Li, H Ch ^b   Zhu, J T ^b   Wang, Z S ^b   Meny, C ^c  

^a SORBONNE UNIVERSITÉ   (France)

^b TONGJI UNIVERSITY   (China)

^c INSTITUT DE PHYSIQUE ET CHIMIE DES MATÉRIAUX DE STRASBOURG   (France)

Author keywords

[No Author keywords available]

Indexed keywords

C-SYSTEMS; CHEMICAL STATE; HARD X RAY; INTER-DIFFUSION; INTERFACIAL CHARACTERIZATION; INTERFACIAL LAYER; INTERFACIAL ROUGHNESS; MULTI-LAYER SYSTEM; NEW SYSTEM; OPTICS APPLICATION; PERIODIC MULTILAYERS; PHOTON ENERGY; S-POLARIZED; X RAY EMISSION SPECTROSCOPY; X RAY REFLECTIVITY;

ATOMIC SPECTROSCOPY; BORON; BORON CARBIDE; EMISSION SPECTROSCOPY; MULTILAYERS; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; RESONANCE; ULTRAVIOLET DEVICES; X RAY DIFFRACTION; X RAY OPTICS;

REFLECTION;

EID: 77951057676     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp911119z     Document Type: Article

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