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Volumn 64, Issue 2, 2008, Pages 193-199
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Thermal cycles, interface chemistry and optical performance of Mg/SiC multilayers
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Author keywords
61.05.cm X ray reflectometry (surfaces, interfaces, films); 68.65.Ac Multilayers; 78.70.En X ray emission spectra and fluorescence
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Indexed keywords
61.05.CM X-RAY REFLECTOMETRY (SURFACES, INTERFACES, FILMS);
68.65.AC MULTILAYERS;
78.70.EN X-RAY EMISSION SPECTRA AND FLUORESCENCE;
HARD X RAYS;
INTERFACE CHEMISTRY;
INTERFACIAL ROUGHNESS;
MULTI LAYERING;
OPTICAL PERFORMANCES;
OPTICAL-;
SOFT X-RAY;
X-RAY EMISSION SPECTROSCOPY;
ANNEALING;
ARSENIC COMPOUNDS;
ATOMIC SPECTROSCOPY;
CHEMISTRY;
CHLORINE COMPOUNDS;
EMISSION SPECTROSCOPY;
MAGNESIUM PRINTING PLATES;
MAGNETRON SPUTTERING;
MOLECULAR SPECTROSCOPY;
MULTILAYERS;
OPTICAL DEVICES;
OPTICAL EMISSION SPECTROSCOPY;
REFLECTION;
OPTICAL MULTILAYERS;
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EID: 52349086578
PISSN: 14346028
EISSN: 14346036
Source Type: Journal
DOI: 10.1140/epjb/e2008-00290-x Document Type: Article |
Times cited : (39)
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References (23)
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