Characterization of Al and Mg alloys from their X-ray emission bands

Microscopy and Microanalysis

Volumn 15, Issue 1, 2009, Pages 36-45

  Jonnard, Philippe ^a   Le Guen, Karine ^a   Gauvin, Raynald ^b   Le Berre, Jean Franois ^b  

^a SORBONNE UNIVERSITÉ   (France)

^b MCGILL UNIVERSITY   (Canada)

Author keywords

Alloys; Electronic structure; Intermetallics; Valence states; X ray emission spectroscopy

Indexed keywords

EID: 67649176536     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609090060     Document Type: Article

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