Characterization of structures from X-ray scattering data using genetic algorithms

Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences

Volumn 357, Issue 1761, 1999, Pages 2827-2848

  Wormington, Matthew ^a   Panaccione, Charles ^a   Matney, Kevin M ^a   Bowen, D Keith ^a  

^a Bede Scientific Inc   (United States)

Author keywords

Data fitting; Differential Evolution; Genetic algorithms; X ray scattering

Indexed keywords

EID: 0345876948     PISSN: 1364503X     EISSN: None     Source Type: Journal    
DOI: 10.1098/rsta.1999.0469     Document Type: Article

References (15)

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