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Volumn 20, Issue 6, 2010, Pages 983-991

983-991 Nanocrystalline electroplated Cu-Ni: Metallic thin films with enhanced mechanical properties and tunable magnetic behavior

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BINARY ALLOYS; COPPER ALLOYS; ELASTIC MODULI; FILM GROWTH; HARD COATINGS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MAGNETISM; SODIUM COMPOUNDS; STACKING FAULTS; SULFUR COMPOUNDS; SURFACE ROUGHNESS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 77950193675     PISSN: 1616301X     EISSN: 16163028     Source Type: Journal    
DOI: 10.1002/adfm.200901732     Document Type: Article
Times cited : (106)

References (65)
  • 11
    • 77950214587 scopus 로고    scopus 로고
    • accessed January
    • Physical properties of permalloy materials, http://www.metanix.co.jp/ metanlx/english/product/permally/index.html (accessed January, 2010).
    • (2010) Physical Properties of Permalloy Materials
  • 61
    • 0004326059 scopus 로고
    • Ed: R. A. Young, Union of Crystallography, Oxford University Press, Oxford
    • The Rietveld Method (Ed: R. A. Young), Union of Crystallography, Oxford University Press, Oxford 1995.
    • (1995) The Rietveld Method


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.