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Volumn 14, Issue 1, 2008, Pages 131-134

Micromechanical characterization of electroplated permalloy films for MEMS

Author keywords

[No Author keywords available]

Indexed keywords

ELASTIC MODULI; ELECTROPLATED PRODUCTS; LOGIC DESIGN; MEMS; MICROMECHANICS; RELIABILITY ANALYSIS; TENSILE STRENGTH;

EID: 34547842548     PISSN: 09467076     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00542-007-0408-z     Document Type: Article
Times cited : (10)

References (8)
  • 1
    • 0030247956 scopus 로고    scopus 로고
    • Comparison of mechanical and tribological properties of permalloy and high moment FeTaN thin films for tape recording heads
    • Deng H, Kevin M, Barnard JA (1996) Comparison of mechanical and tribological properties of permalloy and high moment FeTaN thin films for tape recording heads. IEEE Trans Magn 32:3702-3704
    • (1996) IEEE Trans Magn , vol.32 , pp. 3702-3704
    • Deng, H.1    Kevin, M.2    Barnard, J.A.3
  • 2
    • 0001651737 scopus 로고    scopus 로고
    • Electrodeposited iron group thin-film alloys: Structure-property relationships.
    • Myung NV, Nobe K (2001) Electrodeposited iron group thin-film alloys: structure-property relationships. J Electrochem Soc 148:136-144
    • (2001) J Electrochem Soc , vol.148 , pp. 136-144
    • Myung, N.V.1    Nobe, K.2
  • 6
    • 0031081872 scopus 로고    scopus 로고
    • Design and fabrication of current-pulse-excited bistable magnetic microactuator
    • Ren H, Gerhard E (1997) Design and fabrication of current-pulse-excited bistable magnetic microactuator. Sens Actuators A 58:259-264
    • (1997) Sens Actuators A , vol.58 , pp. 259-264
    • Ren, H.1    Gerhard, E.2
  • 7
    • 0042638058 scopus 로고    scopus 로고
    • Tensile testing of silicon film having different crystallographic orientations carried out on a silicon chip
    • Sato K, Yoshioka T, Ando T, Shikida M, Kawabata T (1998) Tensile testing of silicon film having different crystallographic orientations carried out on a silicon chip. Sens Actuators A 70:148-152
    • (1998) Sens Actuators A , vol.70 , pp. 148-152
    • Sato, K.1    Yoshioka, T.2    Ando, T.3    Shikida, M.4    Kawabata, T.5
  • 8
    • 33745272983 scopus 로고    scopus 로고
    • Electroplating of low stress permalloy for MEMS
    • Zhang Y, Ding G, Cai Y, Wang H, Cai B (2006) Electroplating of low stress permalloy for MEMS. Mater Charact 57:121-126
    • (2006) Mater Charact , vol.57 , pp. 121-126
    • Zhang, Y.1    Ding, G.2    Cai, Y.3    Wang, H.4    Cai, B.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.